A. Gon and A. Mukherjee,"Design of hardware-efficient PVC recognition and classification system for early detection of sudden cardiac arrests", AEU - International Journal of Electronics and Communications, vol.172, no.154955, pp.1-13, Elsevier, December 2023, 10.1016/j.aeue.2023.154955 Article
K. Sahu and A. Mukherjee,"Design of a Self-reconfigurable Incrementer for Fault Tolerant VLSI Architecture", in IEEE Silchar Subsection Conference (SILCON), pp.1-5, IEEE, Silchar, India 2023, https://doi.org/10.1109/SILCON59133.2023.10405199 Inproceedings
A. Mukherjee,"VLSI Architecture Design of Motion Estimation Block with Hexagon-Diamond Search Pattern for Real-Time Video Processing", in IEEE 18th India Council International Conference (INDICON), pp.1-6, IEEE, February 2022, 10.1109/INDICON52576.2021.9691531 Inproceedings
S. Kumar and A. Mukherjee,"A triple-node upset self-healing latch for high speed and robust operation in radiation-prone harsh-environment", Microelectronics Reliability, vol.139, no.114857, pp.1-12, Elsevier, December 2022, 10.1016/j.microrel.2022.114857 Article
S. Kumar and A. Mukherjee,"A Highly Robust and Low-Power Real-Time Double Node Upset Self-Healing Latch for Radiation-Prone Applications", IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol.29, no.12, pp.2076-2085, IEEE 2021, 10.1109/TVLSI.2021.3110135 Article
S. Kumar and A. Mukherjee,"A Self-Healing, High Performance and Low-Cost Radiation Hardened Latch Design", in IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), pp.1-6, IEEE, October 2021, 10.1109/DFT52944.2021.9568359 Inproceedings
A. R, D. Chaudhary, and A. Mukherjee,"Design of Low-Power DDR Controller and DRAM for Deep Learning and Server Applications", in IEEE 4th International Conference on Computing, Power and Communication Technologies (GUCON), pp.1-6, IEEE, November 2021, 10.1109/GUCON50781.2021.9573889 Inproceedings
S. Pal and A. Mukherjee,"A New Power-Gated Hybrid Defect Tolerant Approach Based on Modular Redundancy", in Asian Conference on Innovation in Technology (ASIANCON), pp.1-4, IEEE, October 2021, 10.1109/ASIANCON51346.2021.9544937 Inproceedings
A. Mukherjee and A. S. Dhar,"Defect tolerant majority voter design using triple transistor redundancy", in International Symposium on Smart Electronic Systems (iSES), pp.63-68, IEEE, NIT Rourkela, February 2020, 10.1109/iSES47678.2019.00026 Inproceedings
A. Mukherjee,"Defect Tolerant Approach for Reliable Majority Voter Design Using Quadded Transistor Logic", in IEEE REGION 10 CONFERENCE (TENCON), pp.165-169, IEEE 2020, 10.1109/TENCON50793.2020.9293826 Inproceedings