S. Mukherjee, S. Jain, F. Zhao, J. P. Kar, D. Li, and Z. Shi,"Enhanced photoluminescence from free-standing microstructures fabricated on MBE grown PbSe–PbSrSe MQW structure", Microelectronic Engineering, vol.85, no.4, pp.665-669, Elsevier, April 2008, 10.1016/j.mee.2007.12.018       Article

J. P. Kar, S. Lee, W. Lee, and J. Myoung,"Effect of sputtered films on morphology of vertical aligned ZnO nanowires", Applied Surface Science, vol.254, no.20, pp.6677-6682, Elsevier, August 2008, 10.1016/j.apsusc.2008.04.046       Article

J. P. Kar, S. Mukherjee, G. Bose, and S. Tuli,"Effect of inter-electrode spacing on structural and electrical properties of RF sputtered AlN films", Journal of Materials Science: Materials in Electronics, vol.19, no.3, pp.261-265, Springer, May 2007, 10.1007/s10854-007-9280-y       Article

S. Mukherjee, S. Jain, F. Zhao, J. P. Kar, D. Li, and Z. Shi,"Strain oriented microstructural change during the fabrication of free-standing PbSe micro-rods", Journal of Materials Science: Materials in Electronics, vol.19, no.3, pp.237–240, Springer, April 2007, 10.1007/s10854-007-9261-1       Article

S. Mukherjee, S. Jain, F. Zhao, J. P. Kar, and Z. Shi,"Photoluminescence studies from micropillars fabricated on IV–VI multiple quantum-well semiconductor structure", Microelectronics Journal, vol.38, no.12, pp.1181-1184, Elsevier, December 2007, 10.1016/j.mejo.2007.09.003       Article

J. P. Kar, G. Bose, and S. Tuli,"A study on the interface and bulk charge density of AlN films with sputtering pressure", Vacuum, vol.81, pp.494–498, Elsevier, July 2006, 10.1016/j.vacuum.2006.07.006       Article

J. P. Kar, G. Bose, and S. Tuli,"Correlation of electrical and morphological properties of sputtered aluminum nitride films with deposition temperature", Current Applied Physics, vol.6, no.5, pp.873–876, Elsevier, September 2006, 10.1016/j.cap.2005.05.001       Article

J. P. Kar, G. Bose, and S. Tuli,"Influence of nitrogen concentration on grain growth, structural and electrical properties of sputtered aluminum nitride films", Scripta materialia, vol.54, no.10, pp.1755–1759, Elsevier, May 2006, 10.1016/j.scriptamat.2006.01.038       Article

J. P. Kar, G. Bose, and S. Tuli,"Influence of rapid thermal annealing on morphological and electrical properties of RF sputtered AlN films", Materials Science in Semiconductor Processing, vol.8, no.6, pp.646-651, Elsevier, May 2006, 10.1016/j.mssp.2006.04.001       Article

J. P. Kar, G. Bose, and S. Tuli,"Effect of annealing on DC sputtered aluminum nitride films", Surface and coatings technology, vol.198, no.1-3, pp.64-67, Elsevier, August 2005, 10.1016/j.surfcoat.2004.10.074       Article