Monday - Friday 09:00 hr to 18:00 hr
TIIR Building, NIT Campus, Rourkela, Odisha, 769008

Field Emission Scanning Electron Microscope(Ceramic Engineering )

Instrument Images
CR0014

INSTRUMENT INCHARGE

Swadesh Kumar Pratihar

Professor

Electroceramics, Solid Oxide Fuel Cells

BASIC INFORMATION

  • Make & Model : Thermo Fisher Scientific /FEI Novanano SEM 450
  • Department : Ceramic Engineering
  • Location : CR103
  • Category : Category - I
  • Status : Functional

PRINCIPLE:

FEG Gun Low vacuum mode The FEI Nova NanoSEM 450 is a Schottky Field Emission Scanning Electron Microscope (FE-SEM). It uses a field emission gun (FEG) to produce a high-brightness electron beam, which is focused onto the sample to produce high-resolution images

APPLICATION:

The Nova NanoSEM 450 is used for high-resolution imaging and analysis of materials. It can operate in both high vacuum and low vacuum modes, allowing for the imaging of insulating materials without the need for sample coating5. It is widely used in fields such as materials science, nanotechnology, and biological research.

EXPERIMENTS & CHARGES:

EXPERIMENT - 1

  • Name of Experiment : Morphology and EDS
  • Condition of Analysis : As per MSDS Document and Covering Letter
  • Service Units : 5 Sample
  • Academic & Educational Institution Charges : ₹ 3,540.00
  • R & D National Laboratory Charges : ₹ 7,080.00
  • Industry Charges : ₹ 8,260.00
  • International Charges : ₹ 11,800.00
  • Available for Sample Booking : Yes
  • Remarks : Per Slot 2 Hours for Maximum 5 Samples

EXPERIMENT - 2

  • Name of Experiment : EDX / Mapping
  • Condition of Analysis : Size of sample should be max. 10 x 10 x 10 mm3 stating magnetic and non-magnetic nature of sample, Biological and hygroscopic samples are not preferable, Time slot of 2 hrs and for maximum 5 samples
  • Service Units : 1 Experiment
  • Academic & Educational Institution Charges : ₹ 1,180.00
  • R & D National Laboratory Charges : ₹ 1,475.00
  • Industry Charges : ₹ 1,770.00
  • International Charges : ₹ 2,360.00
  • Available for Sample Booking : Yes
  • Remarks : EDX / Mapping (Additional) (Per EDX Analysis)