R & D Resourses

Scanning Electron Microscope

MM0115

INSTRUMENT INCHARGE

Prof. Debasis Chaira

Professor

Nanomaterials, Physical Metallurgy, Composites

BASIC INFORMATION

Make & Model : SEM: JEOL JSM- 6480 LV, EDS: Oxford Instruments
Department : Metallurgical and Materials Engineering
Location : SEM Lab., PG Building (Ground floor)
Category : Category - I
Status : Functional

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PRINCIPLE:

SEM works on scanning of high energy electron beam on specimen surface. Both SE and BSE are used for imaging purpose. X-rays are used for elemental composition analysis.

APPLICATION:

SEM is used for study of surface or sub-surface structure. Both microstructural and elemental composition analysis can be carried out.

EXPERIMENTS & CHARGES:

EXPERIMENT - 1

Name of Experiment : SEM + EDS with Platinum Coating
Condition of Analysis : AS PER MSDS DOCUMENT AND COVER LETTER
Service Units : 1 Sample
Academic & Educational Institution Charges : ₹ 1,003.00
R & D National Laboratory Charges : ₹ 1,416.00
Industry Charges : ₹ 2,360.00
International Charges : ₹ 3,540.00
Available for Sample Booking : Yes
Remarks : AS PER REQUIREMENT