R & D Resourses

Stylus Surface Profilometer

MM0120

INSTRUMENT INCHARGE

Prof. Archana Mallik

Professor

Advanced Materials Processing, Thin Solid Films

BASIC INFORMATION

Make & Model : Veeco D 150 Stylus surface profiler, Force analysis from 0.05 to 10 mg, height resolution mx 1 A, scan length upto 150 mm, 6 A repeatability, 12.5 micr meter stylus, 3D mapping, Stress analysis
Department : Metallurgical and Materials Engineering
Location : Electrometallurgy and Corrosion Laboratory
Category : Category - II
Status : Non-Functional

BOOKING CLOSED

PRINCIPLE:

The Bruker Stylus Surface Profilometer works by using a diamond-tipped stylus that physically scans the surface of a sample. The stylus moves along the X and Y axes while maintaining contact with the surface, and the vertical movement (Z-axis) is recorded to map the surface topography

APPLICATION:

Thin and Thick Film Measurements: Measuring film thickness and step height2 Surface Roughness: Characterizing surface roughness and waviness 3D Mapping: Producing three-dimensional surface maps Stress Measurement: Calculating tensile or compressive stress on wafers Semiconductor Industry: Quality control and process development1 Research: Academic research in material science and engineering

EXPERIMENTS & CHARGES:

EXPERIMENT - 1

Name of Experiment : Surface roughness
Condition of Analysis : Each sample
Service Units : 1 Sample
Academic & Educational Institution Charges : ₹ 708.00
R & D National Laboratory Charges : ₹ 944.00
Industry Charges : ₹ 1,416.00
International Charges : ₹ 4,720.00
Available for Sample Booking : No
Remarks :

EXPERIMENT - 2

Name of Experiment : Surface roughness
Condition of Analysis : Each sample
Service Units : 1 Sample
Academic & Educational Institution Charges : ₹ 708.00
R & D National Laboratory Charges : ₹ 944.00
Industry Charges : ₹ 1,416.00
International Charges : ₹ 4,720.00
Available for Sample Booking : No
Remarks :