Course Details

Subject {L-T-P / C} : CH6233 : Principles of Analytical and Characterization Instruments {3-0-0 / 3}
Subject Nature : Theory
Coordinator : Prof. Santanu Paria


Spectroscopy: UV-Vis Spectroscopy, Fluorescence spectroscopy, Raman spectroscopy, Energy dispersive X-ray spectroscopy (EDS), Fourier Transform Infrared Spectroscopy (FTIR), Atomic absorption spectroscopy (AAS).
Chromatography: Gas-liquid chromatography (GLC), GC-MS, High performance liquid chromatography (GLC).
Microscopy: Optical microscopy, Scanning probe microscopy [(Atomic force microscopy (AFM), Scanning Tunneling Microscopy (STM)], Scanning Electron microscopy (SEM), Field Emission Scanning Electron microscopy (FESEM), Transmission Electron microscopy (TEM), Scanning Transmission Electron microscopy (STEM).
Thermal analysis: Thermo Gravimetric Analysis (TGA), Differential Scanning Calorimetry (DSC)
X-Ray: X-ray diffractometry (XRD), X-ray fluorescence Spectrometry (XRF), X-ray Photo-electron Spectroscopy (XPS)
Characterization techniques for particles suspension and interfaces: Particle size analyzer (DLS), Rheometer, Surface and interfacial Tensiometer, Contact angle meter.

Course Objectives

  1. Analytical instruments are very much essential in chemical related industry and research institutes to analyze chemicals and characterize products. The chemical engineering students should not only learn to apply and interpret the data generated with these techniques but also they must learn to operate instruments and design measurement protocols for the systems being studied. Significant understanding on both analytical and materials characterization instruments will develop such skills among the chemical or materials scientists/engineers.

Course Outcomes

Course Outcomes:
(1) Knowledge gain on the operational principles of the instruments.
(2) Knowledge gain on the analysis of analytical data obtained from the instruments.
(3) Knowledge gain on the analysis of samples by different techniques as per requirement.

Essential Reading

  1. Sam Zhang, Lin Li Ashok Kumar, 1. Materials Characterization Techniques, CRC Press , 2008
  2. Yang Leng, John, 2. Materials Characterization: Introduction to Microscopic and Spectroscopic Methods, Wiley & Sons , 2009

Supplementary Reading

  1. Egerton, Ray, 3. Physical Principles of Electron Microscopy: Introduction to TEM, SEM, and AEM, Springer , 2005
  2. R S Khandpur, Handbook of Analytical Instruments, Tata McGraw-Hill , 2006