राष्ट्रीय प्रौद्योगिकी संस्थान राउरकेला
National Institute of Technology Rourkela

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Seminar Title
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To study the Effect of Austempering Time and Temperature on Various Mechanical Properties and Morphology of ADI
Seminar Type
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Registration Seminar
Department
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Metallurgical and Materials Engineering
Speaker Type
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Student
Speaker Name
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Ms. Ventrapragada Bramaramba (Roll No: 516MM1009)
Date  &  Time
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16 Jul 2018  4:30 pm
Venu
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Department Seminar Room -MM
Contact
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2550
Abstract
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Austempered Ductile Cast Iron (ADI) has emerged as an important commercial engineering material in recent years because of excellent properties such as high strength with good ductility as well as fatigue strength and fracture toughness together with excellent wear resistance. These properties are as a result of a microstructure composed primarily of acicular ferrite (α) and high carbon austenite (γHC). In the present work, cylindrical tensile specimens (for fatigue and wear tests) were prepared from an alloyed nodular ductile cast iron as per ASTM standards and were austempered at different temperatures as well as different lengths of times. After completion of heat treatment process strength, toughness, wear resistance and fatigue strength would be measured for this DI samples. Literature is rich focusing on investigate the mechanical properties of ADI material; however, very few attempts have been made to compare the results of mechanical properties of austempered ductile iron to annealed, tempered, normalized, quenched and quench & tempered of ductile iron samples. In the proposed work, this is intended to be investigated. In addition, influence of each process parameter such as material type, austempering time and temperature on mechanical properties of ADI would be investigated by using Analysis of Variance (ANOVA) method. Effect of austempering time and temperature on the various mechanical properties and fracture behaviour of ADI intended to be investigated. Surface morphology and micro-structure of aforesaid samples would be analysed through scanning electron microscopy (SEM) and XRD.
 
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